Thanks to Yolanda Morilla for the presentation. We also would like to thank to the organizing committee for giving us the opportunity to present our work in the SCC - Session “Components, Radiation, Packaging”. And a special thanks to Junta de Andalucía and Andalucía TECH which thanks to RIS3 framework has investing on the field of Artificial Inteligence with Space Application, where started the #PRECEDER project developing.
Pedro Martín-Holgado, Amor Romero-Maestre, José de-Martín-Hernández, Florian Krimmel, Thomas Borel, Michele Muschitiello, Alessandra Costantino, Ferdinando Tonicello, Christian Poivey, Anastasia Pesce, Olga Ramos, Manuel Domínguez and Yolanda Morilla
Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases
ABSTRACT. The NewSpace era has drastically increased the use of COTS (Commercial-off-the-shelf Components) to cover the needs of the new requirements: lower costs, shorter lead times, and better performances. However, the radiation risks associated with non-radiation hardened components are especially relevant in this context. Therefore, new approaches must be considered necessary to address this challenge for the assurance of radiation hardness. This work presents standard and parameterized radiation databases and how they can be used to numerically assess the critical variability from lot to lot in response to gamma radiation based on the coefficient of variation.